In-line AOI System
“Tran AI Wafer Defect Detection System” is an optical inspection system designed to replace the human eye for the inspection process in semiconductor wafer production lines. The system provides flexible in-line installation capability, which will cater to customization for each customer's current production equipment. This adaptable design produces a 100% inspection rate with no impact, whatsoever, on wafer throughput or cycle time.
Trancom is a system integration solution provider company established on September 2000.
Our most successful project was the APC (Advanced Process Control) system, which established long-lasting trust with Taiwan semiconductor fabs such as TSMC, UMC, Micron, etc.
Our new project started 2022 in developing the AOI (Automatic Optical Inspection) and vibration sensor.
The advanced AI defect detection system can detect abnormal patterns by using a deep learning process to identify the properties of a defect.
The AI system also has the flexibility to create new models for new products in the customer production line.
This most advanced design will be quickly installed into the production line to replace human inspection, with a lower implementation cost, and keep track of production wafers.
